The solar cell industry has been
truly remarkable to observe over the past ten years. During this
time, the industry has sustained a CAGR of more than 40 percent in
cell production. Silicon consumption is currently twice that of the
much more mature semiconductor industry.1
Up until the first half of 2008, attractive operating margins were
sustained throughout most of the supply chain. However, since the
second half of 2008, like most other industries, the Photovoltaic
(PV) industry is experiencing significant challenges. The current
credit crisis has impacted initiation of new PV projects and module
supply is currently exceeding that of demand. New manufacturing
capacity, which was being added to meet the growth frenzy during the
first half of 2008, is making a bad situation worse. Companies that
entered into long term silicon contracts at the peak of last year are
scrambling to renegotiate their contracts to more accurately reflect
the significant drop in silicon prices. Some sources are predicting
module prices will decrease from $3.80/watt to between $2.50 and
$3.00/watt during 2009.2
Fig 2 Overview of Wet Chemistry
Processing Steps Used in c-Si Solar Cell Manufacturing
Despite these troubled times, the PV
industry remains one of the few industries with sustainable long-term
growth opportunity. Macroeconomic drivers such as concerns over
imported oil dependence and global warming remain strong even during
the current economic situation. Oil prices appear to have hit bottom
and will likely increase again as the world economy recovers.
Although some countries like Spain are reducing government subsidies,
other countries like the United States, Japan, and South Korea are
showing indications of increasing incentives to create future demand
for solar energy. The anticipated sharp drop in the $/watt is a
necessary and positive step for the industry to achieve grid parity,
which will make solar generated power competitive with power received
from the grid independent of government subsidies. As a result, those
companies that have managed the growth wisely over the past years
should be able to weather the storm and are likely to emerge even
stronger than before.
Fig 3 Comparisons of Time to Remove
Graphite from Silicon Surface. All Chemistries Shown Were Processed
at 50ºC
One of the key factors for any solar
cell manufacturer to survive during such difficult times is the
ability to achieve high device performance at a low cost. Wet
chemical processing has been adopted from other more mature
industries such as the semiconductor and printed circuit board
industries and plays a key role in solar cell manufacturing. The
purpose of this article is to highlight the areas where wet chemical
processing is being utilized in the solar cell manufacturing process
while giving some insight of how it can further improve cell
efficiency and overall costs.
Fig 4 Various Wafer Appearances
Before and After Clean
Simplistically stated, a solar cell is
a semiconductor device that creates electricity from the sun by
utilizing the photovoltaic effect (see Figure 1). Photons are
absorbed from the sun by the silicon layer and excite nearby
electrons sufficiently enough to create a current in an electrical
circuit. The most common metric to quantify performance is cell
efficiency, which represents the ability of the solar cell to convert
sunlight into electricity. An increase in cell efficiency yields more
power per device. Depending upon the technology, cell efficiencies
can range anywhere from 8 percent to as much as 22 percent in
production settings.
Figure 2 shows a generic process flow
for the manufacture of a silicon solar cell. The key steps that
currently utilize wet chemistry processing include: post-wafering
cleaning, texturing, edge isolation, phosphor silicate glass (PSG)
remove/clean, and plated metallization. Table 2 outlines some of the
main market drivers for each of these process steps. Depending upon
the process line configuration, production throughput for any one of
these steps can be in the range of 1500-2800 wafers per hour. Wafers
can be loaded into cassettes for batch/vertical processing or loaded
onto a conveyor belt for continuous/horizontal processing. Both
equipment configurations are currently commercially available on the
market from a number of vendors.
Fig 5 Metal Ion Contamination as a
Function of Different Cleaning Chemistries
Most silicon used for the solar cell
industry is grown and/or machined to produce blocks called ingots.
Due to the different growth processes used, multi-crystalline ingots
are square, while mono-crystalline ingots are square with rounded
corners. They are typically about 0.54 m. long and have x-y
dimensions of 15.6cm x 15.6cm. The wafering process is accomplished
by use of a wire saw, which is comprised of a series of very thin
stainless steel wires (0.12-0.15mm in diameter) that are wound on two
spools. Glycol, oil, or water based lubricants dispersed with silicon
carbide abrasives provide the primary cutting action as the wire
passes through the ingot. Typical wafer thickness after sawing is
about 180-200µm, although thinner wafers have been demonstrated.
Fig 6 Pyramid Formation as a
Function of KOH Concentration. All Conditions Were Etched for 10
minutes @ 90ºC
After the wafering step, the sliced
ingot is placed into a spray chamber to remove the bulk of the
silicon carbide slurry. The sliced ingot is then placed in a dip tank
with a solvent that can loosen the adhesive (typically an organic
acid) and releases the wafers from the mounting plate. Wafers are
then loaded into cassettes for vertical/batch mode cleaning or
arranged on a conveyor belt for horizontal/continuous processing.
A successful cleaning process,
regardless of whether it is in the vertical or horizontal
configuration, should have the following attributes:
Fig 7 Resulting Wafer Topography
After Acidic Texturing Step on Multi Crystalline Wafer
1. Ability to produce wafers visually
free of any lubricant, abrasive, or metal ion residues
2. Ability to work on mono-crystalline
and multi-crystalline wafers
3. Wide process latitudes to handle
significant variation of incoming wafer cleanliness quality
4. Provide a uniform surface compatible
with subsequent texturing/saw damage removal
5. Meet demanding waste stream
regulations
Many types of chemistries are used for
the cleaning process and include water, surfactants, solvents, acids,
and alkalis. However, not all materials clean with the same degree of
effectiveness. Figure 3 shows a comparison of how long it takes to
clean off pencil lead from a silicon substrate using three different
alternatives. It is also quite common to see varying degrees of
contamination on the wafers prior to cleaning. Contamination can
range from excessive dried SiC slurry to residual metal and metal
oxides from the wire during wafering. Contamination from metal oxides
can be enhanced visually if they are not removed prior to any silicon
etching/removal. Figure 4 shows wafers with different contamination
levels pre- and post-cleaning. As a result, it’s important to
understand the origin of the incoming wafer contamination so that the
proper cleaning process can be optimized to produce a uniform
appearance.
As advanced solar cell designs emerge,
more cell producers are concerned about residual metal contamination.
As a result, wafers need to emerge from the cleaning process with
very low trace metal contaminant levels. Figure 5 shows typical metal
levels through various parts of the cleaning process.
1. Ability to produce wafers visually
free of any lubricant, abrasive, or metal ion residues
2. Ability to work on mono-crystalline
and multi-crystalline wafers
3. Wide process latitudes to handle
significant variation of incoming wafer cleanliness quality
4. Provide a uniform surface compatible
with subsequent texturing/saw damage removal
Fig 8 Examples of Front and Rear
Side Metallization on Two Types of Wafers Used in PV Industry
Many types of chemistries are used for
the cleaning process and include water, surfactants, solvents, acids,
and alkalis. However, not all materials clean with the same degree of
effectiveness. Figure 3 shows a comparison of how long it takes to
clean off pencil lead from a silicon substrate using three different
alternatives. It is also quite common to see varying degrees of
contamination on the wafers prior to cleaning. Contamination can
range from excessive dried SiC slurry to residual metal and metal
oxides from the wire during wafering. Contamination from metal oxides
can be enhanced visually if they are not removed prior to any silicon
etching/removal. Figure 4 shows wafers with different contamination
levels pre- and post-cleaning. As a result, it’s important to
understand the origin of the incoming wafer contamination so that the
proper cleaning process can be optimized to produce a uniform
appearance.
As advanced solar cell designs emerge,
more cell producers are concerned about residual metal contamination.
As a result, wafers need to emerge from the cleaning process with
very low trace metal contaminant levels. Figure 5 shows typical metal
levels through various parts of the cleaning process.
Fig 9 Schematic of Basic Operating
Theory for Light Induced Plating
The next step after cleaning is wafer
texturing. The texturing step has two primary purposes:
1. Etch the wafer to remove any
residual saw damage
2. Provide a matte surface to minimize
light reflection
For mono-crystalline wafers, a blend
of potassium hydroxide (KOH) and isopropanol (IPA) are typically used
to achieve the purposes described above.4
Concentrations of each component can vary depending upon the process
but are typically less than 10 percent for each. Process temperatures
are between 80oC to 90oC. The KOH provides the anisotropic etching
along the <100> plane of the silicon crystal, which exposes the
<111> plane. The role of the IPA is to help control KOH etch
rate (~1-2 µm/min) and selectivity to the <111> crystal plane,
which leads to the random pyramid structure as shown in Figure 6.
Balancing the etch rate with pyramid formation is important to ensure
that enough silicon is removed to optimize saw damage removal
(typically >6µm per side), while maintaining the correct peak
density to minimize reflection. Figure 6 also shows how the substrate
can be polished etched if the KOH concentration is not kept within
the desired range.
Due to the volatility of the IPA,
alkaline texturing is typically conducted in vertically configured
wet chemical equipment to allow for lower processing temperatures
(typically 80oC) while accommodating longer process times (typically
20-30 minutes). However, novel processes are being developed, which
can replace the IPA and will enable higher operational temperatures
and shorter process times. Such systems also are compatible with
inline horizontal equipment configurations.
To achieve uniform texturing across a
multi-crystalline wafer, an etching solution that provides an
isotropic etch to the different silicon crystal orientations must be
used. Typically a blend of nitric acid (HNO3) and hydrofluoric acids
(HF) are used to texturize multi-crystalline wafers. The role of the
nitric acid is to oxidize the silicon while the hydrofluoric acid is
responsible for the bulk etching. Silicon etch rates for acidic
texturing are usually in the range of 2-4 µm/min. Due to the
exothermic nature of this reaction, process temperatures are
typically < 10oC range. Figure 7 shows the resulting topography of
a multi-crystalline wafer after being texturized with HNO3/HF
process.
Equipment configuration with the
acidic texturing process is typically in the horizontal mode.
Volatile organic species are less of a concern, but generation of
nitrogen oxide gases and safe handling of the acids (especially the
hydrofluoric) needs to be considered carefully. Alternative wet
chemistries that can minimize or even replace the use of hydrofluoric
acid are currently being researched.
For either alkaline or acidic
processes, a final hydrochloric rinse step is used to remove any
metal ion contamination prior to the p-n junction formation step.
Doping/PSG etch/edge isolation
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The next step in the manufacturing
process is to create the p-n junction through a doping step. Dopant
chemistry is deposited and diffused into the solar cell to create a
thin layer called an emitter layer. Most of today’s crystalline
silicon solar cells start off as a p-type doped wafer and the emitter
layer is n-type doped. The most common n-type source is phosphorous,
which can be applied using chemical vapor deposition or by use of
spray/mist application. Phosphoric acid based solutions are used as
the doping source for spray applications. The wafers are then fired
to peak temperatures of over 850oC to diffuse the phosphorus into the
silicon. The resistance of the emitter layer can be adjusted by
varying the amount of material sprayed onto the wafers and/or by
changing the firing temperature/time.
During the diffusion step, a phosphor
silicate glass (PSG) is formed on the surface and must be removed.
Typically this step is achieved using a glass etch step, which is
comprised of a dilute hydrofluoric acid solution.5
Unlike the texturing step, the PSG etch step does not contain any
oxidizers so that the selectivity of the HF to the underlying emitter
layer is quite good. Subsequent cleaning of the wafers surface may be
followed to ensure the surface is completely removed of any residual
PSG.
The emitter layer is now present on
both sides (and/or on edges) of the wafer and must be isolated to
prevent short circuiting the solar cell. Edge isolation can be
accomplished using laser ablation, plasma etching, or wet chemical
etching. Wet chemistry isolation is accomplished by immersing the
rear side and edges of the wafer in an HF-based chemistry. Due to
surface tension effects between the substrate and chemistry, the
emitter layer on the front side is not exposed to the etchant. Wafers
are then coated with a thin layer of silicon nitride, which improves
device reliability and serves as an anti reflection layer.
Metallization
The purpose of metallization on solar
cells includes the following:
1. Provides a means of collecting
electrons from the front side of the cell
2. Creates a back surface field that
improves the electron migration properties within the bulk silicon
3. Creates a mirror on the backside of
the wafer to reflect light back into the wafer
4. Provides a means for connecting
numerous cells to create a working module
Figure 8 shows some examples of
multi-crystalline and mono-crystalline silicon solar cells that have
been metallized on the front side and rear side, respectively.
Traditionally, the front side grid (FSG) metallization is
accomplished by using fritted silver pastes while the backside of the
wafer is metallized with a combination of silver and aluminum fritted
pastes. In order to make contact through the silicon nitride layer to
the underlying silicon layer, the pastes are first dried at
temperatures around 150oC and then fired at temperatures over 850oC
for a few seconds.
Recently, plating of wafers in
combination with, and/or in replacement of, screen printed
metallization has been getting increased attention. Plating of solar
cells can be done with electro-less or electrolytic techniques. For
some applications, such as depositing a thin seed layer that is less
than 1µm thick, electro-less plating can provide sufficient plating
rates to fit into production requirements. Electro-plating is used to
build thicker deposits, but making contact to the front side of the
wafer can be challenging as the wafers are only 180-200 µm thick and
can break easily.
An alternative method called Light
Induced Plating (LIP) has been developed that takes advantage of the
current generation properties of the solar cells.6
As Figure 9 shows, the wafers are placed faced down and travel across
a series of lights, which creates a localized electric field on the
front side of the wafer. Contact is made on the backside of the wafer
with specially designed contact rollers. The voltage of the roller
can be controlled to minimize anodic dissolution and attach on the
backside of the wafer, thereby creating preferential plating of the
desired metal on the front side.
Fig 11 Solar Cell Performance
Improvement Due to LIP Ag Plating Process
One of the primary improvements wafer
plating offers over existing paste technology is through improved
deposit conductivity. Figure 10 shows a picture of a silver plated
deposit over screen printed silver paste. Note the porosity in the
paste deposit as compared to the plated deposit. This porosity
decreases the overall conductivity of the deposit, which in turn
creates a collection finger that is higher in resistance as compared
to a plated feature that is solid. The data in Figure 11 shows the
decrease in series resistance and corresponding increase in cell
efficiency as a result of the LIP silver plating process (Enlight
620) versus using paste alone.
As with most plating processes, the
deposition process is isotropic in nature, which means that the line
width is increasing as thickness increases. Although this effect can
have a small impact on increasing the degree of shadowing, it also
can help to improve yield distributions by mending discontinuous seed
layers that result from wetting problems/defects from the screen
print process.
New cell designs are emerging that
utilize much thinner finger designs to improve the overall electron
collection efficiency and to reduce shadowing effects. Unfortunately,
screen print technology has limited resolution below 80µm. Recent
advancements with inkjet and aerosol deposition technology are
allowing for seed layers to be deposited with resolution in the
30-40µm range. Plating is required because these seed layers are
typically quite thin and would result in very high resistance values
of the final collection finger.
Recent cost pressures have created the
demand for lower cost materials that can be used for metallization
such as copper. It is well published that copper has the ability to
migrate through bulk silicon, which can compromise the p-n junction
and ruin cell performance. If copper is to be used for metallization
purposes, then a barrier layer such as nickel must be used. It is
important to note that the silicon nitride layer should be
sufficiently dense enough so as to not expose the underlying silicon
layer, which would result in background plating and increased copper
migration. Screen print technology is not conducive to depositing
nickel or copper deposits and, therefore, most of the attention is
being placed on using plating technology to realize copper
metallization.
Summary
Despite going through some growing
pains, the photovoltaic industry is well positioned to continue
growing over the long term. Wet chemical processing technology from
the semiconductor and printed circuit board industries have
successfully been adopted in most crystalline silicon manufacturing
lines. The technology is being used in a number of different process
steps with various equipment configurations and process chemistries.
In order to meet future demand for improved cell performance at lower
costs, continued improvement in the process capabilities will be
required. As new processes are introduced, it will be important to
consider the impact they may have on subsequent processing steps and
overall cell performance.
Acknowledgements
1. Photon International, March 2009, p
88
2. Solar Market: Dip in 2008, Rise by
2011, Retrieved on 4/13/2009 from http://www.redherring.com
3. Photon International, March 2009, p
190
4. Sparber et al, Comparison of
Texturing Methods for Monocrystalline Silicon Solar Cells Using KOH
and Na2CO3, Conference on Photovoltaic Energy
Conversion, 2003
5. Wet Chemical Edge Isolation for
Solar Cells, Euro-Asia Magazine, September 2007, Retrieved on
4/12/2009 from
http://www.euroasiasemiconductor.com/euroasia-magazine/online-midseptember2007
6. Allardyce et al, The Commercial
Application of Light Induced Electroplating for Improving the
Efficiency of Crystalline Silicon Solar Cells, 22nd EU PVSEC, Milano,
Section 2-2.2
MattMoynihan mmoynihan@rohmhaas.com
Matt Moynihan is R&D Director,
Photovoltaic Business Interconnect Technologies, for Dow Electronic
Materials.
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