Intelligent Design: On the Use of Blind and Buried Vias
by Lee Ritchey
July 1, 2009
In
recent months, I have encountered a number of high-layer-count PCB
designs with high-pin-count BGAs, such as FPGAs with 1 mm pitch
contacts, designed with blind and buried via technology. Using this
technology, these PCBs have been difficult to design, difficult to
manufacture, more expensive than their through-hole counterparts, and
difficult to test and troubleshoot. At the same time, PCBs of similar
complexity and density were being done in the same number of layers
using standard through-hole technology with none of these drawbacks,
and at lower overall cost.
Two specific cases were eighteen-layer
PCBs used in networking products. The same basic circuit was being
manufactured using standard through-hole technology with all of the
advantages of low cost, ease of layout, and ease of test. The
fabrication drawing consisted of only one page and had a single drill
file. At the same time, a second PCB using the blind and buried via
approach cost 20 percent more to build, took twice as long to layout,
was very difficult to test, and had an eight-page fabrication
drawing, four drill files, and still required eighteen
layers.
I was curious as to why these designs
were being done this way when it was not an improvement over the
standard through-hole method normally used for such designs. Upon
investigation, I discovered that there are presentations being made
at conferences and some classes being taught that claim that
combining blind and buried vias on this class of design saves layers
by allowing many of the signals to be routed on layer two of the PCB.
From practical experience, this has turned out not to be
true.
There are places where combining blind
and buried via technology serves a very important role. Among these
are cell phone PCBs and high-pin-count BGA packages. In these cases,
the motivation isn’t to save layers. Rather, it is to make possible
designs that would otherwise have no solution. Cell phones, due to
their compact size, have fine pitch components mounted on both sides
of a single PCB. If standard through-hole technology were employed,
component holes from components mounted on one side of the PCB would
penetrate mounting pads of components mounted on the other side. In
order to avoid this problem, blind vias are used to reach into the
second or third layer of the PCB where connections are made to other
circuit pins or power rails. This is done on both sides of the PCB
connecting to a common core in the center that contains the power
distribution networks. The result is a core with four or more layers
built with conventional through-hole technology that has built-up
layers on both sides, which are connected to the core using blind
vias. This is often referred to as build-up technology. It is easy to
see that this process will cost more than a like number of layers
using standard through-hole technology. This is the price paid for
miniaturization.
Dense, high-pin-count BGA packages use
blind and buried vias in a build-up process much like that used for
cell phone PCBs, but for another reason. The balls or bumps on the
BGA die are usually placed on an 8 mil (.203 mm) pitch. This pitch is
far too fine to allow through-hole vias. As a result, tiny, blind
vias are used to penetrate to layer two and three of the package
where very fine traces fan out to the 1mm or 50 mil pitch balls on
the bottom of the package that finally interfaces with the main
PCB.
In neither of these cases was the
motivation to save layers, save design time, or improve testability.
In fact, the opposite is usually true. The use of blind and buried
vias was to make the product possible at all! Testability is
compromised in the case of the cell phone PCB due to the fact that
few, if any, of the component pins are accessible for conventional
in-circuit testing. As a result, the components used in such a design
must contain special test circuits such as boundary scan or JTAG that
allow testing from a few test pins that access each IC from a special
test connector. When a design is done with through-hole technology,
all device pins are accessible from the back side of the PCB making
it easy to do in-circuit test, as well as allowing easy attachment of
oscilloscope probes during troubleshooting.
After much review, I have determined
that those giving the advice to use blind and buried via technology
on PCBs where it is not the best solution are well intentioned.
However, those who follow this misplaced advice are paying a very
high price. When a technology that works in one area is transferred
without adequate qualification, the results can be mixed at the very
least and disappointing at the worst. Those giving the advice owe it
to their audience to make sure that, in their enthusiasm to promote a
concept, it fits where it is being offered. Not doing so can result
in some very bad end results that are not cost competitive or timely.
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